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SPECTROSCOPIC
ELLIPSOMETERS |
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SENresearch -
variable angle spectroscopic ellipsometer family for
research and development with wide spectral range
(190 –2500 nm).
Read more. |
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SENDURO®
- automated spectroscopic ellipsometer with
predefined applications for multi-layer analysis.
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SE 900-50 -
spectroscopic IR ellipsometer with wide spectral
range (2 µm – 25 µm).
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lASER
ELLIPSOMETERS
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SE 400adv ,
SE 500adv - multiple angle
laser ellipsometers with advanced hard- and software
for most accurate measurement of film thickness and
optical constants of single films and layer stacks.
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LaserPro -
low cost laser ellipsometer.
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SE 300 -
handheld laser ellipsometer for ithe measurement
of protective coatings on curved surfaces.
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REFRACTOMETERS |
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FTPadvanced - Film
Thickness Probe for measurement of film thickness
and optical constants of transparent and
semitransparent films.
Read more. |
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FTPadvanced reflectometer -
highly precise wide spectral range reflectometer for
measurements of film thickness, optical constants
and materials composition.
Read more. |
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FTPadvanced
scalable large area stage. |
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ELLIPSOMETERS
and
REFRACTOMETERS for INDUSTRIAL QC |
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SENDURO®
- automated spectroscopic ellipsometers for routine
use.
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SE 801
- spectroscopic ellipsometer for in-line control.
Read more. |
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Micro spot spectroscopic ellipsometer with 47 x 47
µm2 spot (OEM module). |
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SE 300 -
handheld laser ellipsometer for industrial quality
control of protective coatings on curved surfaces.
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FTPadvanced
scalable large area stage for industrial quality
control. |
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SE 400-STA - compact laser
ellipsometer with self-alignment aid for off-line
routine measurements of thin films on sheet metal
stripes. |
